Subject: Küldés: PI Datasheet Details P-725 PIFOC® Long-Range, High-Speed Nanofocusing Z-Drives with Direct Metrology ; PI Ultra Precision Motion Control
From: Szénásy István <[email-masked]>
To: Dr Szénásy István <[email-masked]>
Date: Mon, 24 Sep 2007 22:01:55 +0200

PI Datasheet | Details: P-725 PIFOC® Long-Range, High-Speed Nanofocusing Z-Drives with Direct Metrology ;     PI: Ultra Precision Motion Control

     

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      P-725   
            PIFOC® Long-Range, High-Speed Nanofocusing Z-Drives with Direct Metrology

                            

           
                 
                    a.. Scans and Positions Objectives with Sub-nm Resolution
                    b.. High Linearity and Stability with Direct-Measuring Capacitive Sensors
                    c.. Travel to 460 µm, Fast Response & Settling Time
                    d.. Frictionless Precision Flexure Guiding System
                    e.. Enhanced Guiding Precision for Better Focus Stability
                    f.. Ask about DIC Prism Holder Option
                    g.. Controller Compatible with MetamorphT Imaging Software
                    h.. Quick Lock Adapter for Easy Attachment

                  P-725 PIFOCs® are long-travel, high-speed, piezo-driven microscope objective nanofocusing/scanning devices.
                  Despite the increased travel ranges (up to 460 µm), they are 20% shorter than P-721 units (see page see link), while providing sub-nanometer resolution. Equipped with ultra-precise, direct-measuring capacitive sensors, these devices are ideal for tasks such as surface metrology or deconvolution microscopy (Z-stack acquisition). The newly designed, frictionless, flexure guiding system provides enhanced precision for superior focus stability with fast response for rapid settling and scanning.

                  P-725 PIFOCs® are mounted between the turret and the objective, extending the optical path by only 12.5 mm (infini-ty corrected microscope re-quired; extension tubes are available to adjust path lengths of other objectives on the turret). Custom designs for positioning the complete turret are available on request.

                  Superior Accuracy Through Direct-Motion Metrology with Capacitive Sensors
                  P-725s are equipped with absolute-measuring, direct-metrology capacitive sensors. These sensors make possible motion linearity to 0.03% with effective resolution in the sub-nanometer range. They boast high bandwidth and exhibit no periodic errors.
                  Unlike conventional sensors, capacitive sensors measure the actual distance between the fixed frame and the moving part of the stage. They detect errors contributed by all components in the drive train -from the actuator through the flexures to the platform. This results in higher motion linearity, long-term stability, phase fidelity, and-because external disturbances are seen by the sensor immediately-a stiffer, faster-responding servo-loop. See p. see link ff. and p. see link ff. for more information.

                  Fastest Step-and-Settle: 25 Milliseconds for 250 Microns
                  The P-725.2CL can perform a 250 µm step to 1% accuracy in only 25 ms (E-665.CR controller, no load) and in 50 ms with a load of 150 g.

                  Controllers
                  A variety of analog and digital controllers is available to drive these units. The P-725.xCD models can be operated with the E-665 servo-controller through an analog or digital interface (see page see link). The E-750 high-speed digital NanoAutomation® controller can also be used (see page see link). 

                  Working Principle / Reliability
                  PIFOCs® are equipped with the award winning PICMA® piezo drives, integrated into a sophisticated flexure guiding system. The wire-EDM-cut flexures are FEA modeled for zero stiction, zero friction and exceptional guiding precision. The ceramic-encapsulated PICMA® drives are more robust than conventional piezo actuators, featuring superior lifetime and performance in both dynamic and static applications. 
                  Because guidance, actuators and sensors are all frictionless and maintenance-free, these nanopositioning systems achieve outstanding levels of reliability.

                  Notes
                  For low-profile, large aperture Z stages, see the P-541.ZSL on p. see link and the P-541.ZCD on p. see link.
                  See the "Selection Guide" on p. see link ff. for comparison with other nanopositioning systems.

                  Application Examples 
                    a.. Scanning interferometry 
                    b.. Surface structure analysis 
                    c.. Disk drive testing 
                    d.. Autofocus systems 
                    e.. Confocal microscopy 
                    f.. Biotechnology 
                    g.. Semiconductor test equipment

                  P-725.2CL with Quick Lock option P-721.12Q for W0.8 x 1/36" threads and objective. 

                  P-721.12Q Quick Lock thread adapter, exploded view with microscope objective and PIFOC®. Mounting tools are included. 

           

     

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